Vintage RAM Tester - Compact Design, fast checking, Open-Source HW & SW
Designed by tops4u in Switzerland
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Vintage DRAM Tester Fast – Precise – Open for many 8-/16-bit systems like C64, C128, Amigas, Atari 800XL, 1040ST and others, Apple IIe, Spektrum and many more. For a more complete list, check the com…
Read More…Fast – Precise – Open for many 8-/16-bit systems like C64, C128, Amigas, Atari 800XL, 1040ST and others, Apple IIe, Spektrum and many more. For a more complete list, check the compatibility List on Github compatiblity.md
Order with or without OLED Display. Without further remarks if you choose without display then I'll program the Firmware without OLED which makes testing around 2.5secs faster and provides clearer feedback with the BiColor-LED. Comment if you like the OLED firmware for boards without display.
Most Arduino-based DRAM testers need up to 2 mins or even more for a single 41256 RAM and check only basic functions.
This project completes a full memory, address, data-line and retention time test in 15 s or less. (or even 2.5sec faster without the Display).
It is probably the fastest Arduino solution which also covers static-column DRAMs, cell retention time and 20-pin ZIP packages.
Feature | Benefit |
---|---|
Most Tests are <= 10 s | Rapid diagnosis on the workbench or at retro repair events |
Retention-time measurement | Detects weak chips by checking it meets the min retention times |
Static-column support | Reliable testing of 44258, 514402 static column functions |
20-pin ZIP socket | Direct test of 20-pin ZIP DRAMs without an adapter |
Optional OLED display or LED blink codes | Full text feedback or minimal hardware setup |
Open hardware and firmware | KiCad, Gerber files and Arduino source under an open licence |
Supported HW | Check the compatiblity List on GitHub |
Capacity | DIP | 20-pin ZIP | Static column | Retention Time | Test Time |
---|---|---|---|---|---|
16 K × 4 | 4416 | – | – | 4ms | 2.6sec |
64 K × 1 | 4164 | - | – | 2ms | 3.5 sec |
64 K × 4 | 4464 | – | – | 4ms | 5.2 sec |
256 K × 1 | 41256 | - | – | 4ms | 8.9 sec |
256 K × 4 | 44256 | both | 44258 | 4ms | 3.8 sec |
1 M x 1 | 411000 | NO! | - | 8ms | 28 sec |
1 M × 4 | 514400 | both | 514402 | 16ms | 8.9 sec |
Note: Above test times include the OLED Display. Without Display, the test durations are approx 1.7 sec shorter.
There is a short YouTube video demonstrating the tester in action. (Note: the video shows a prototype, the current SMD Design can be seen above. Handling without Display remains identical):
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